Presentation Information
[23a-A311-5]Nanoscale phase change of Cr2Ge2Te6 induced by THz near-fields
〇DANGIL KIM1, Mizuki Kawaji1, Ryo Tamaki1, Satoshi Kusaba1, Yinli Wang2, Yi Shuang3, Yuji Sutou2,3, Ikufumi Katayama1, Jun Takeda1 (1.Yokohama Nat'l Univ., 2.Tohoku Univ., 3.AIMR)
Keywords:
phase change memory,chalcogenide thin films,scanning tunneling microscope