[23a-B202-1~10] 1.5 Instrumentation, measurement and Metrology

11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[23a-B202-10] DC current-induced magnetic field observation using a multifunctional scanning probe microscope

〇Yuki Oyama¹, Masaki Sumi¹, Nobuo Satoh¹ (1.Chiba Institute of Tech.)

Keywords:

scanning probe microscope

We have developed a multifunctional scanning probe microscope capable of simultaneously measuring surface topography, surface potential, and surface magnetic field at the same place. As an observation sample, we fabricated a patterned electrode with a width of approximately 5 mm and applied a direct current of +30 mA and -30 mA from a stabilized power supply to the electrode. In the magnetic field image obtained by changing the direction of current flow, a reversal of contrast between the left and right sides was observed across the metal wire boundary. This suggests the detection of magnetic forces corresponding to the change in the direction of the magnetization induced by the current-induced magnetic field at the probe.