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[16a-A21-8]Study on AlN Surface Oxidation Process for Polarity-Inverted Stacking Structures

〇Tomohiro Tamano1, Kanako Shojiki1,2, Ryota Akaike1,3, Hiroki Yasunaga1,3, Takao Nakamura1,3, Masahiro Uemukai4, Tomoyuki Tanikawa4, Ryuji Katayama4, Hideto Miyake1,3 (1.Mie Univ., 2.Kyoto Univ., 3.IC-SDF, 4.Osaka Univ.)
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Keywords:

nitride semiconductor,sputtering,polarity-inversion


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