[17p-D63-1~16] 7.2 Applications and technologies of electron beams

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[17p-D63-7] Interference experiment using single-electron detection with an SOI pixel detector

〇Yuichi Ishida¹, Takafumi Ishida^1,2, Makoto Kuwahara^1,2, Yasuo Arai³, Koh Saitoh^1,2 (1.Grad. Sch. of Eng., Nagoya Univ., 2.IMaSS, 3.KEK)

Keywords:

transmission electron microscopy,SOI pixel detector