[18a-B4-1~10] 6.6 Probe Microscopy

10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)

[18a-B4-7] Considering a suitable bias voltage in scanning ion conductance microscopy

〇Shoma Kamei¹, Shinji Watanabe² (1.NanoLS,Kanazawa Univ., 2.WPI-NanoLSI, Kanazawa Univ.)

Keywords:

scanning ion conductance microscopy,scanning probe microscopy