Session Details
[18a-B4-1~10]6.6 Probe Microscopy
Wed. Sep 18, 2024 9:00 AM - 11:30 AM JST
Wed. Sep 18, 2024 12:00 AM - 2:30 AM UTC
Wed. Sep 18, 2024 12:00 AM - 2:30 AM UTC
B4 (Exhibition Hall B)
Kei Kobayashi(Kyoto Univ.), Jo Onoda(福岡教育大)
[18a-B4-1]AFM observation of spin-induced lattice distortion in O2 monolayer
Mitsuo Kimura1, Yuji Kunisada2, 〇Yoshiaki Sugimoto1 (1.Univ. Tokyo, 2.Hokkaido Univ.)
[18a-B4-2]Time evolution for energy dissipation in dynamic atomic force microscope
〇Tomohiro Shigeno1, Yuuki Yasui1, Yoshiaki Sugimoto1 (1.Univ. Tokyo)
[18a-B4-3]Visualization of the local dipole moment at the Si(111)-(7x7) surface using DFT calculations
〇Akira Sumiyoshi1, Kohei Yamasue2, Yasuo Cho2, Jun Nakamura1 (1.UEC-Tokyo, 2.Tohoku Univ.)
[18a-B4-4]Investigation of Si(111) by Hybrid-KPFM
〇Sota Odani1, Yasuhiro Sugawara1, Li Yanjun1 (1.Osaka Univ.)
[18a-B4-5]3D Calculation of Field-Enhancement Characteristics of Semi-Indirect Illumination TERS Probes
〇Masanao Ito1, Kaifeng Zhang2, Kei Kobayashi1 (1.Kyoto Univ., 2.Hitachi Ltd.)
[18a-B4-6]Fabrication of probes for non-gap mode tip-enhanced Raman spectroscopy using FIB
〇Kazunori Hirosawa1, Kaifeng Zhang2, Masanori Hara1, Masamichi Yoshimura1 (1.Toyota Tech. Inst., 2.Hitachi, Ltd.)
[18a-B4-7]Considering a suitable bias voltage in scanning ion conductance microscopy
〇Shoma Kamei1, Shinji Watanabe2 (1.NanoLS,Kanazawa Univ., 2.WPI-NanoLSI, Kanazawa Univ.)
[18a-B4-8]Improvement response characteristics of bias modulation mode scanning ion conductance microscopy with capacitance compensation pipette
〇Hitoshi Inomata1, Kenta Nakazawa1, Toshi Nagata2, Hideya Kawasaki2, Osamu Hoshi3, Futoshi Iwata1 (1.Shizuoka Univ., 2.Hamamatsu Univ. School of Medicine, 3.Tokyo Medical and Dental Univ.)
[18a-B4-9]Considering an Automated Method to Adjust Feedforward Controller Parameters in Scanning System
〇Kazuki Miyashita1, Shinji Watanabe2 (1.Grad.Sch.Math.&Phys.,Kanazawa Univ, 2.WPI-NanoLSI, Kanazawa Univ.)
[18a-B4-10]Data Processing Method for High-Speed Three-dimensional Scanning Force Microscopy
〇Ryoshu Higashi1, Yoichi Kumagai1, Masayoshi Okamoto1, Takeshi Fukuma1, Kazuki Miyata1,2 (1.Kanazawa Univ., 2.PRESTO/JST)