[18a-B4-1~10] 6.6 Probe Microscopy

11:00 AM - 11:15 AM JST(2:00 AM - 2:15 AM UTC)

[18a-B4-9] Considering an Automated Method to Adjust Feedforward Controller Parameters in Scanning System

〇Kazuki Miyashita¹, Shinji Watanabe² (1.Grad.Sch.Math.&Phys.,Kanazawa Univ, 2.WPI-NanoLSI, Kanazawa Univ.)

Keywords:

feedforward control,scanning ion conductance microscopy