Presentation Information
[18a-P07-7]Evaluation of anisotropy of refractive index of GaN thin film on ScAlMgO4 substrate using terahertz wave
〇Kaito Tsuchida1, Takashi Fujii1,2, Toshiyuki Iwamoto2, Momoko Deura1, Tsutomu Araki1 (1.Ritsumeikan Univ., 2.NIPPO PRECISION)
Keywords:
THz,GaN,Ellipsometry
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