Presentation Information
[18p-A31-17]RF bias dependence on low temperature etching of SiO2 by CF4/H2 plasma
〇Yusuke Imai1, Shih-Nan Hsiao2, Makoto Sekine2, Takayoshi Tsutsumi2, Kenji Ishikawa2, Masaru Hori2 (1.Nagoya U. Eng., 2.Center for Low-temperature Plasma Science)
Keywords:
Plasma,Low-temperature etching,Surface analysis
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