[18p-A36-1~11] Application of Advanced Ion/Electron Microscopy for Future Nanoscale Materials and Devices

5:00 PM - 5:30 PM JST(8:00 AM - 8:30 AM UTC)English Presentation

[18p-A36-9] In-situ and precise atomic-scale transmission electron microscopy for electronic materials

〇Yukio Sato¹ (1.Kumamoto Univ.)

Keywords:

Electron microscopy,In-situ observation,Dielectrics

Intriguing physical properties of materials often originate from their micro and nano-scale structures and their responses to external stimuli. In this context, we explore dielectric materials as a prime example. The emergence of dielectricity, piezoelectricity, and ferroelectricity is closely linked to the intricate details of the crystal unit cell and the structure of domains where the polarization of numerous unit cells is aligned in the same direction. Moreover, the response of these structures to applied external electric fields plays a significant role. (Scanning) Transmission electron microscopy is a powerful method that enables us to elucidate detailed unit-cell and domain structures, along with their responses to an electric field, with high spatial resolution and in real time. In this talk, we will introduce some of our key results.