講演情報
[18p-A36-9]In-situ and precise atomic-scale transmission electron microscopy for electronic materials
〇Yukio Sato1 (1.Kumamoto Univ.)
キーワード：
Electron microscopy、In-situ observation、Dielectrics
Intriguing physical properties of materials often originate from their micro and nano-scale structures and their responses to external stimuli. In this context, we explore dielectric materials as a prime example. The emergence of dielectricity, piezoelectricity, and ferroelectricity is closely linked to the intricate details of the crystal unit cell and the structure of domains where the polarization of numerous unit cells is aligned in the same direction. Moreover, the response of these structures to applied external electric fields plays a significant role. (Scanning) Transmission electron microscopy is a powerful method that enables us to elucidate detailed unit-cell and domain structures, along with their responses to an electric field, with high spatial resolution and in real time. In this talk, we will introduce some of our key results.
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