[20p-B3-1~15] 6.3 Oxide electronics

1:15 PM - 1:30 PM JST(4:15 AM - 4:30 AM UTC)

[20p-B3-2] Clarification of voltage-current characteristics and interface states of
metal/Nb:SrTiO₃ junctions by ICTS method

〇Yumeng Zheng¹, Kentaro Kinoshita¹ (1.Tokyo Univ. of Sci.)

Keywords:

Schottky junction,ICTS,interface states

我々は深い準位を測定できる等温過渡容量分光法(ICTS)を用いて、金属/NSTO界面状態とメモリー動作の関係の解明を目指す。