[20p-C32-1~11] 16.3 Bulk, thin-film and other silicon-based solar cells

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[20p-C32-11] Evaluation of Stress around Electrodes of Crystalline Silicon Solar Cells under Temperature Change

〇(M2)Koki Hasebe¹, Ryo Yokogawa^1,4, Kyotaro Nakamura², Yoshio Ohshita², Noboru Yamada³, Atsushi Ogura^1,4 (1.Meiji Univ., 2.Toyota Tech. Inst., 3.Nagaoka Univ. of Tech., 4.Meiji Renewable Energy Laboratory)

Keywords:

Crystalline silicon solar cells,Raman spectroscop,thermal cycling tests

Through the long-term reliability evaluation of crystalline silicon solar cells, cracks are often observed by Electroluminescence (EL) measurements after thermal cycling tests around the vicinity of bus bar electrodes. We performed temperature-variable Raman measurements and showed that repeated thermo-mechanical stresses in thermal cycling tests may cause cracks from the bus-bar electrode. In this report, we investigate the influence of temperature variation in detail by comparing the temperature-variable Raman measurements at distance of 5 mm from the bus-bar electrode.