Presentation Information

[22p-21C-4]Carrier diffusion processes in InGaN quantum wells measured by time-resolved PL measurements

〇Osuke Ito1, Keito Mori1, Atsushi Yamaguchi1, Maiko Ito2, Rintaro Koda2, Tatsushi Hamaguchi2 (1.Kanazawa Inst. of Tech., 2.Sony Semiconductor Solutions Corp.)

Keywords:

InGaN quantum wells,carrier diffusion,time-resolved PL measurements