[23p-12M-1~13] 16.1 Fundamental properties, evaluation, process and devices in disordered materials

2:45 PM - 3:00 PM JST(5:45 AM - 6:00 AM UTC)

[23p-12M-6] Quantitative evaluation of low OH concentration quartz glass using infrared photothermal deflection spectroscopy

〇Tamihiro Gotoh¹ (1.Gunma Univ.)

Keywords:

quartz glass,OH concentrations,photothermal deflection spectroscopy

Quantification of trace amounts of OH in silica glass plates using photothermal deflection spectroscopy (IR-PDS) extended to the infrared region is reported. IR-PDS detects trace amounts of OH based on the amount of heat generated during non-radiative processes during light irradiation. The infrared absorption spectra of silica glass with five different OH concentrations were investigated. In addition to the standard OH band around 3640 cm^-1, the presence of coupling tones, overtones, and absorption due to water was demonstrated. IR-PDS can be used to quantify OH concentrations below 1 ppmw in quartz glass plates.