Presentation Information

[23p-1BN-5]DNA Thin Films Fabricated via Laser Molecular Beam Deposition: Characterization of electrical conduction properties

〇Hakurin Liu1, Sui Liu1, Shohei Ishikawa1, Tekkou Kou1, Tomohiro Murata2, Xuechen Shen2, Kosuke Minami3, Tomohiko Yamazaki3, Tomomasa Sato1, Katsuhiko Ariga3,2, Nobuyuki Matsuki1 (1.Kanagawa Univ., 2.The Univ. of Tokyo, 3.NIMS)

Keywords:

DNA,Laser deposition,Thin-film functional materials

The resistivity of intrinsic deoxyribonucleic acid (DNA) is 108 ~109 Ω·cm, which is almost insulator-like and has semiconducting carrier transport properties, and is known to change significantly depending on water adsorption, the content ratio of Guanine (G)-Cytosine (C) pairs and Adenine (A)-Thymine (T) pairs, and intercalation of metal ions, therefore, it is expected to be applied as a molecular electronics materials. We are aiming to realize novel device applications of DNA thin films by using laser molecular beam deposition (LMBD) method, which enables hybrid molecular layer deposition for a wide range of inorganic and organic materials (T. Murata et al., Bull. Chem. Soc. Jpn. Jpn., 96, 29 (2022)). In this study, we evaluate the electrical conductivity properties of DNA thin films formed by LMBD.