Presentation Information

11:15 AM - 11:30 AM JST(2:15 AM - 2:30 AM UTC)

[24a-71A-9]Characterization of surface conductivity with THz time-domain ellipsometry

Sou Watanabe¹, 〇Masaya Nagai¹, Masa Ashida¹, Haobo Li², Azusa Hattori², Hidekazu Tanaka² (1.Engineering Science, Osaka Univ., 2.Sanken, Osaka Univ.)

Keywords:

ellipsometry,terahertz,thin film

We perform terahertz time-domain ellipsometry on thin films and show that surface conductivity can be easily derived without using a dielectric multilayer film model.

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