[24p-12B-1~15] CS.1 Code-sharing Session of 2.3 & 7.4

5:30 PM - 5:45 PM JST(8:30 AM - 8:45 AM UTC)

[24p-12B-15] Correlation analysis of TOF-SIMS data of a mixed polymer sample coexisting with contaminants

Rentaro Murakami¹, 〇Kousuke Moritani¹, Norio Inui¹ (1.Univ. of Hyogo)

Keywords:

TOF-SIMS,cluster ion beam,multivariate analysis

In this study, we apply correlation analysis to analyze a series of TOF-SIMS data obtained from a mixed model sample of two types of polymers (PS, PEG) with contaminants coexisting and identify peaks based on the correlation coefficient. We compared the results with multivariate analysis methods (principal component analysis; PCA, multivariate curve resolution; MCR) and clustering methods (k-means method), which have been conventionally used to analyze TOF-SIMS data.