[24p-1BJ-1~9] Beyond Graphene

4:45 PM - 5:15 PM JST(7:45 AM - 8:15 AM UTC)

[24p-1BJ-7] Structural analysis and manipulation of low-dimensional materials
by scanning probe microscopy

〇Yoshiaki Sugimoto¹ (1.Univ. Tokyo)

Keywords:

Silicene,Atomic force microscopy,Scanning probe microscopy