Presentation Information
[24p-P07-8]Automated Synchrotron XRD Pattern Analysis and its Application to Residual Stress Mapping
〇Kazuma Yanai1, Keiji Kuno1, Satoru Suzuki1, Noriko Seki1, Jun Hasegawa1, Taisuke Ono1 (1.DENSO CORP.)
Keywords:
clustering,residual stress,X-ray diffraction
In order to improve product performance and assess product life, it is necessary to measure and analyse the XRD patterns of the entire surface of materials constituting the product using high intensity and high brightness synchrotron radiation to determine the residual stresses of the materials. However, (i) the throughput of XRD pattern analysis has not improved much, and (ii) manual analysis of a large number of XRD patterns causes artificial dispersion and bias in the results. Therefore, in this study, an automated XRD pattern analysis method was developed and the residual stress distribution of resin materials was visualised.