[25a-12M-1~11] 7.2 Applications and technologies of electron beams

11:45 AM - 12:00 PM JST(2:45 AM - 3:00 AM UTC)

[25a-12M-11] Lifetime measurement of graphene/p-Si Schottky junction electron emission devices

〇Katsuhisa Murakami¹, Hiromasa Murata¹, Noriyuki Miyata¹, Masayoshi Nagao¹ (1.AIST)

Keywords:

Graphene,electron emission,Schottky junction