[25p-1BC-1~11] 12.2 Characterization and Materials Physics

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)

[25p-1BC-5] Accurate evaluation of atomic concentration at a surface of organic semiconducting thin film using X-ray photoelectron spectroscopy

〇Kyohei Nakano¹, Yuto Ochiai¹, Yumiko Kaji¹, Keisuke Tajima¹ (1.RIKEN CEMS)

Keywords:

Organic semiconductor,X-ray photoelectron spectroscopy