[25p-1BC-1~11] 12.2 Characterization and Materials Physics

3:45 PM - 4:00 PM JST(6:45 AM - 7:00 AM UTC)

[25p-1BC-9] EFM, KPFM measurement of photo-induced charge separation on F8T2 monolayer/ TiO₂ interface

〇Tomoki Misaka¹, Naoki Hara², Hiroshi Ohyama¹, Shusaku Nagano², Takuya Matsumoto¹ (1.Osaka Univ., 2.Rikkyo Univ.)

Keywords:

electrostatic force microscopy,Kelvin probe force microscopy