Presentation Information

2:45 PM - 3:00 PM JST(5:45 AM - 6:00 AM UTC)

[10p-S201-7]Depth analysis of perovskite film using cryo-GCIB-TOF-SIMS

〇Chizuru Asahara¹, Takahiko Ikarashi¹, Tomohiro Sakata¹, Hiroko Futamura¹, Shin Inamoto¹, Tomoya Nakamura², Minh Anh Truong², Noboru Ohashi², Atsushi Wakamiya² (1.TRC, 2.Kyoto Univ.)

Keywords:

Perovskite solar cells,TOF-SIMS,analysis

In this study, time-of-flight secondary ion mass spectrometry (TOF-SIMS) using a gas cluster ion beam (GCIB) was performed under sample cooling for depth analysis of perovskite films. Although damage to the perovskite film induced by ion beam irradiation was an issue, sample cooling suppressed the analytical damage and made it possible to perform precise depth profiling.

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