Presentation Information

[7a-P05-42]Visualizing Defect Mapping of Laser-Induced Graphene with ERT

〇Keiya Minakawa1, Yuki Kimura1, Tirawat Nontiwantok2, Winadda Wongwiriyapan2, Osamu Kubo3, Takashi Ikuno1 (1.Tokyo Univ. of Sci., 2.KMITL, 3.Gifu Univ.)

Keywords:

laser-induced graphene,electrical resistance tomography,nondestructive testing