Presentation Information
[7p-N103-3]Current status and future prospects of research on soft errors in semiconductor devices caused by cosmic ray muons
〇Yukinobu Watanabe1 (1.Kyushu Univ.)
Keywords:
semiconductor devices,soft error,cosmic ray muon
One of the serious problems in the reliability of semiconductor devices is the soft error problem caused by cosmic rays. A soft error is a temporary malfunction that occurs when exposed to cosmic rays. As miniaturization and power consumption become more advanced, radiation resistance for semiconductor devices is decreasing, and there is concern about soft errors caused not only by cosmic ray neutrons but also by cosmic ray muons. In this presentation, we will focus on the soft error phenomenon caused by negative muons, and report on the progress of research to date and future prospects.