Presentation Information

3:15 PM - 3:45 PM JST(6:15 AM - 6:45 AM UTC)

[7p-N103-4]Project of Muon Microscopies

〇Yukinori Nagatani¹, Junichi Ohnishi², Takayuki Yamazaki¹, Yuga Nakazawa¹, Taihei Adachi², Toshikazu Adachi¹, Akira Goto², Patrick Strasser¹, Yu Ohishi¹, Motonobu Tampo¹, Shogo Doiuchi¹, Koichiro Shimomura¹, Yasuhiro Miyake¹ (1.KEK, 2.Riken)

Keywords:

Muon,Microscopy,Electromagnetic field distribution

The principles, technology, applications and prospects of muon microscopies currently under development at KEK are repored. A muon microscope is an analog of an electron microscope, where electrons are replaced with muons. A transmission muon microscope (TμM) is being developed as an analog of a transmission electron microscope (TEM), while a scanning positive muon microscope (Sμ⁺M) and a scanning negative muon microscope (Sμ^-M) are being developed as equivalents of a scanning electron microscope (SEM). TμM visualizes the electromagnetic field distribution inside thick materials, Sμ⁺M visualizes the magnetic properties of material surfaces, and Sμ^-M visualizes both elemental- and isotope- distribution.

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