[7p-N301-1~17] CS.7 Code-sharing session of 6.1&13.3&13.5

4:15 PM - 4:30 PM JST(7:15 AM - 7:30 AM UTC)English Presentation

[7p-N301-13] Imprint Behaviors of Hf_0.5Zr_0.5O₂ Ferroelectric Capacitors: Charge/Trap-site Dynamics during Write and Wake-up Cycles

〇(D)Zhenhong Liu¹, Zuocheng Cai¹, Mitsuru Takenaka¹, Shinichi Takagi², Kasidit Toprasertpong¹ (1.Univ. Tokyo, 2.Teikyo Univ.)

Keywords:

Hafnia-based ferroelectrics,reliability issues,imprint