Presentation Information
[8p-N202-18]Wafer-level characterization of integrated optical devices using OFDR (2)
- Formulation of waveguide multiple reflections in transmission and reflection profiles–
〇Tsuyoshi Horikawa1, Nobuhiko Nishiyama1,2 (1.Science Tokyo, 2.PETRA)
Keywords:
silicon waveguides,optical frequency domain reflectometry,reflection coefficient
The multiple reflections due to distributed reflections in the waveguides were formulated, which are observed superimposed on the main reflected signal in the OFDR in-depth profiles for the optical circuits. It was confirmed that the derived formula well reproduced both of the OFDR transmission and reflection profiles for the silicon waveguide, and that the distributed reflection coefficient of the waveguides can be accurately extracted by fitting.