Presentation Information
[8p-N307-2]Nanoscale Molecular Arrangement in Thermally Converted Benzoporphyrin Thin Films Revealed by Polarized Spectroscopy Using AFM-IR
〇(DC)Takayuki Oka1, Nobutaka Shioya1, So Ueno1, Mitsuaki Yamauchi1, Hiroko Yamada1, Takeshi Hasegawa1 (1.ICR, Kyoto Univ.)
Keywords:
Organic semiconductor,Atomic force microscopy,Infrared specroscopy
<!--StartFragment-->Benzoporphyrins (BP) are excellent organic semiconductor materials, and BP thin films are formed from precursor thin films through thermal conversion reactions. Although many previous studies have already investigated the reaction processes of the precursor materials of BP, few focuses on the structural distribution within the thin films. In this study, the distribution of reaction intermediates has been investigated by AFM-IR, which measures infrared (IR) spectra in microscopic regions of atomic force microscope (AFM) images. As a result, the structural distribution of complex thin films containing intermediates are revealed at the nanoscale for the first time.<!--EndFragment-->