Presentation Information
[8p-P02-4]Time-Resolved Potential Measurement of Organic Thin-Film Transistors Using Heterodyne-Amplitude-Modulation Kelvin-probe Force Microscopy
〇Kota Hibi1, Kei Kobayashi1 (1.Kyoto Univ.)
Keywords:
Atomic Force Microscopy(AFM),Kelvin-probe Force Microscopy(KFM),Organic semiconductor
Organic Thin-Film Transistors (OTFTs) are expected to be used in many fields because they are flexible and easy to make. However, their performance is often limited by injection barriers and traps at the interface. We developed a method called PP-HAM-KFM, which combines pump-probe Kelvin probe force microscopy (PP-KFM) with heterodyne amplitude modulation (HAM). Using this method, we observed potential changes in OTFTs with a time resolution of 10 µs and found that carriers were accumulated in some grains.