[9a-N403-1~11] 7.2 Applications and technologies of electron beams

10:30 AM - 10:45 AM JST(1:30 AM - 1:45 AM UTC)

[9a-N403-6] Improving the spatial resolution of a scanning ultrafast electron microscopy using high repetition laser

〇Kensuke Miura¹, Nikolai Gaku Okamoto¹, Shoji Yoshida¹, Jun-ichi Fujita¹, Yusuke Arashida¹ (1.Univ. Tsukuba)

Keywords:

Scanning Electron Microscopy,fs laser,Space Charge Effect