[9p-N201-1~14] 6.1 Ferroelectric thin films

2:30 PM - 2:45 PM JST(5:30 AM - 5:45 AM UTC)

[9p-N201-5] Ferroelectric Characterization through C–V Measurements with Nanoelectrodes

〇Yoshiomi Hiranaga¹, Yasuo Cho² (1.Tohoku Univ. RIEC, 2.Tohoku Univ. NICHe)

Keywords:

ferroelectrics,scanning probe microscopy,C-V measurement

In this talk, we will discuss whether feature parameters extracted from datasets obtained using a scanning probe microscopy technique called local C-V mapping are useful indicators for evaluating polarization reversal characteristics.