Presentation Information
[9p-N301-19]Bayesian Inference Analysis of Time-Resolved Photoluminescence Decay Behavior in an InGaN Quantum Well
〇Kazunori Iwamitsu1, Itsuki Shimbo2, Zentaro Akase1, Toshiya Yokogawa1, Atsushi Yamaguchi2, Shigetaka Tomiya1 (1.NAIST, 2.Kanazawa Inst. of Tech.)
Keywords:
Bayesian Infeence,Time-Resolved Photoluminescence,Stretched Exponential
Temperature-dependent time-resolved photoluminescence spectral mapping (TRPL-SM) data of an In0.24Ga0.76 single quantum well were analyzed using Bayesian inference to estimate the parameters of the photolumnescence decay curves and evaluate them statistically. The fitting function considered both stretched exponential (SE, 0 < β ≤ 1) and compressed exponential (CE, 1 < β < 2) models. Consequently, the shape parameter β was found to vary with emission energy, exhibiting behavior that transitions between CE and SE.Details of the physical interpretation will be presented in the talk.