Presentation Information

[9p-N303-7]Spin Characteristics of Silicon Vacancy in 4H-SiC under Microwave Waveguide

〇Shinichi Tamura1, Kosuke Tahara1, Haruko Toyama1, Katsuhiro Kutsuki1, Yuichi Yamazaki2, Takeshi Ohshima2,3 (1.Toyota Central R&D Labs., Inc., 2.QST, 3.Tohoku Univ.)

Keywords:

quantum sensor,silicon carbide

A quantum sensor was developed using silicon vacancies (VSi) in 4H-SiC crystals, assuming a silicon carbide (SiC) device structure. A microwave waveguide with a metal thin-film pattern was created to enable targeted microwave irradiation of specific VSi. Techniques such as ODMR, Rabi oscillation, and Spin Echo were used to evaluate spin characteristics, including spin-spin relaxation time (T2). These results suggest potential future applications in predicting failures in SiC devices.