[9p-N307-1~15] 6.6 Probe Microscopy

4:15 PM - 4:30 PM JST(7:15 AM - 7:30 AM UTC)

[9p-N307-11] Sharpening of electron beam deposited carbon probes for enhancing speed of Nanoendoscopy-AFM

〇Ryoya Kanai¹, Mutsumi Ehara¹, Keisuke Miyazawa^1,2, Kazuki Miyata^1,2, Takeshi Fukuma^1,2 (1.Kanazawa Univ., 2.WPI-NanoLSI)

Keywords:

Scanning Probe Microscope