Session Details
[9p-N307-1~15]6.6 Probe Microscopy
Tue. Sep 9, 2025 1:30 PM - 5:30 PM JST
Tue. Sep 9, 2025 4:30 AM - 8:30 AM UTC
Tue. Sep 9, 2025 4:30 AM - 8:30 AM UTC
N307 (Lecture Hall North)
[9p-N307-1]Improvement of spatial resolution in FM-AFM potentiometry using heterodyne method
〇Eiichi Taji1, Gilbert Pado1, Ryota Fukuzawa1, Hiroaki Benten1, Masakazu Nakamura1 (1.NAIST)
[9p-N307-2]Dual Bias Modulation Electrostatic Force Microscopy on Cross-section of n-GaN/n-GaN Junction Fabricated by Surface-activated Bonding
〇Kohhei Mizutani1, Sihan Wen1, Daichi Kobayashi1, Ryota Fukuzawa1, Jianbo Liang3, Naoteru Shigekawa3, Takuji Takahashi1,2 (1.IIS, Univ. Tokyo, 2.Nano Quine, Univ. Tokyo, 3.Osaka Metropolitan Univ.)
[9p-N307-3]Observation of PN patterned silicon by Heterodyne Pump-Probe Phase Modulation Kelvin Probe Force Microscopy
〇Yuto Mukai1, Yasuhiro Sugawara1 (1.Graduate School of Engineering, UOsaka)
[9p-N307-4]Data Processing Algorithms for Localization 3D Atomic Force Microscopy
〇Ryoshu Higashi1, Ayaka Imamura1, Kaito Hirata2, Takeshi Fukuma1, Kazuki Miyata1 (1.Kanazawa Univ., 2.Nagoya Inst. Tech.)
[9p-N307-5]Visualizing Bias-Dependent Changes in Ionic Liquid-SrTiO3 Interface Structures by 3D scanning force microscopy
〇Haohui Zhang1, Takashi Sumikama1, Kazuki Miyata1, Sunao Shimizu2, Yoshihiro Iwasa3, Takeshi Fukuma1 (1.Kanazawa Univ., 2.Toyama Prefectural Univ., 3.RIKEN CEMS)
[9p-N307-6]Combination of infrared vibrational spectroscopy with dissipation measurements
using frequency modulation atomic force microscopy II
〇Yuta Okabe1, Yuki Araki1, Masahiko Tomitori1, Toyoko Arai2 (1.Kanazawa Univ., 2.JAIST)
[9p-N307-7]Effect of Cleaning Conditions on the Surface Structure and Properties
of Silica Glass
〇Yuki Araki1, Taketoshi Minato2, Toyoko Arai1 (1.Kanazawa Univ., 2.IMS)
[9p-N307-8]Three-dimensional visualization of charge distribution of biofilms using scanning ion conductance microscopy
〇Seima Yamamoto1, Moeka Takado2, Nobumitsu Hirai2, Kenta Nakazawa1, Futoshi Iwata1,3 (1.Shizuoka Univ., 2.Suzuka Collage, 3.RIE Shizuoka Univ.)
[9p-N307-9]Evaluation of mechanical properties of onion epidermal cells by atomic force microscopy
〇Shogo Nakamura1, Yuka Tsuri1,2, Yoichiroh Hosokawa1,2 (1.Div. Mat. Sci., NAIST, 2.MLC, NAIST)
[9p-N307-10]Long-Term t-SPESI Mass Spectrometry Imaging Using Fluorinated Probes
〇(M1)Takao Yasuda1, Kato Tasuku2, Otsuka Yoichi1, Michisato Toyota1 (1.Graduate School of Science, Univ. Osaka, 2.School of Science, Univ. Osaka)
[9p-N307-11]Sharpening of electron beam deposited carbon probes for enhancing speed of Nanoendoscopy-AFM
〇Ryoya Kanai1, Mutsumi Ehara1, Keisuke Miyazawa1,2, Kazuki Miyata1,2, Takeshi Fukuma1,2 (1.Kanazawa Univ., 2.WPI-NanoLSI)
[9p-N307-12]BioLever AFM Probes: From Concept to Manufacturing
〇Adarsh Sandhu1, Takeshi Hayasaka2, Takayuki Uchihashi3 (1.UEC Tokyo, 2.Applied NanoStructures, Inc, 3.Nagoya University)
[9p-N307-13]Fabrication of Au-deposited cantilever tips for tip-enhanced Raman spectroscopy (3)
〇Shuolei Li1, Kei Kobayashi1 (1.Kyoto Univ.)
[9p-N307-14]Implementation of Lifted Retrace Scan Function for Long-range Force Subtraction Correction of Potential Images Measured by in-liquid AFM
〇Kotaro Nishida1, Masami Okamoto1, Shoken Kojitani1, Ryosyu Higashi1, Kazuki Miyata1, Takeshi Fukuma1 (1.Kanazawa Univ)
[9p-N307-15]Establishing Conditions for Forming Lead Phthalocyanine Thin Film on HOPG Substrate for Molecular Orientation Detection Experiments by Open-Loop Electric Potential Microscopy
〇Hiroto Ogawa1, Takashi Sumikama1, Takeshi Fukuma1 (1.Kanazawa Univ.)