Presentation Information

[9p-N307-9]Evaluation of mechanical properties of onion epidermal cells by atomic force microscopy

〇Shogo Nakamura1, Yuka Tsuri1,2, Yoichiroh Hosokawa1,2 (1.Div. Mat. Sci., NAIST, 2.MLC, NAIST)

Keywords:

atomic force microscopy,onion scale leaf