Presentation Information
[9p-N307-9]Evaluation of mechanical properties of onion epidermal cells by atomic force microscopy
〇Shogo Nakamura1, Yuka Tsuri1,2, Yoichiroh Hosokawa1,2 (1.Div. Mat. Sci., NAIST, 2.MLC, NAIST)
Keywords:
atomic force microscopy,onion scale leaf