Presentation Information
[9p-N401-7]Surface observation of CoO thin films using low energy atom scattering spectroscopy
〇Goon Tan1, Hiroaki Fukuta1, Kenta Kaneko2, Akifumi Matsuda2, Kenji Umezawa1 (1.Osaka Metro. Univ., 2.Inst. of Science Tokyo)
Keywords:
surface atomic structure of insulator,low energy atom scattering spectroscopy,topotactic phase transformation
Topotactic phase transformation from rocksalt-type CoO to spinel-type Co3O4 while retaining the crystallographic relationship has been reported upon vacuum ultraviolet (VUV) light irradiation on CoO surfaces. In this study, we aim to elucidate the surface structural changes of CoO thin films induced by VUV irradiation. We report the results of surface analysis using low-energy atom scattering (LEAS) spectroscopy performed on CoO thin films after VUV exposure. By employing LEAS, which utilizes electrically neutral incident atoms as probes, we successfully observed the surface structure of insulating oxide materials.