Presentation Information

[9p-N403-14]Electron beam operating time of NEA-InGaN Photocathodes

〇Atsushi Koizumi1, Daiki Sato1,2, Tomohiro Nishitani1,2, Yoshio Honda2, Hiroshi Amano2 (1.Photo electron Soul, 2.IMaSS, Nagoya Univ.)

Keywords:

photocathode,electron gun,InGaN

We investigated the current durability of our newly developed NEA-InGaN photocathode. Its durability is reported here based on two key evaluations: the operational lifetime under a constant emission current maintained via feedback control, and the effects of accelerated aging tests where ion back bombardment was induced by introducing nitrogen gas during electron emission.

Comment

To browse or post comments, you must log in.Log in