Presentation Information
[9p-N403-14]Electron beam operating time of NEA-InGaN Photocathodes
〇Atsushi Koizumi1, Daiki Sato1,2, Tomohiro Nishitani1,2, Yoshio Honda2, Hiroshi Amano2 (1.Photo electron Soul, 2.IMaSS, Nagoya Univ.)
Keywords:
photocathode,electron gun,InGaN
We investigated the current durability of our newly developed NEA-InGaN photocathode. Its durability is reported here based on two key evaluations: the operational lifetime under a constant emission current maintained via feedback control, and the effects of accelerated aging tests where ion back bombardment was induced by introducing nitrogen gas during electron emission.
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