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[9p-N403-15]Charge-reduced SEM imaging by modulating e-beam from an NEA-InGaN semiconductor photocathode

〇Mitsunobu Yasuda1, Tomohiro Nishitani2,3, Atsushi Koizumi2, Yuta Arakawa2, Kohtaro Niimi2, Daiki Sato2,3, Sumihisa Ishikawa1, Yuji Otsuka1 (1.Toray Research Centre, 2.Photo electron soul, 3.Nagoya Univ.)
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Keywords:

photocathode,electron gun,InGaN


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