[14p-K507-1~17] CS.5 Code-sharing Session of 6.5 & 7.5

1:30 PM - 1:45 PM JST(4:30 AM - 4:45 AM UTC)

[14p-K507-3] Atomic-scale characterization of molten Ga/Cu-Ga alloy interface by atomic force microscopy

〇Takashi Ichii¹, Hiroki Kataoka¹, Naoya Suzuki¹, Toru Utsunomiya¹ (1.Kyoto Univ.)

Keywords:

atomic force microscopy,molten metal,alloy

The molten metal/solid metal interface is crucial for the formation of intermetallic materials, but analytical methods for this interface are extremely limited. In this presentation, we report an atomic-scale structural analysis of the molten Ga/Cu-Ga alloy interface by atomic force microscopy (AFM).