Presentation Information
[14p-P07-55]Development of Electrical Impedance Tomography with Asymmetric Electrode Configurations for Improving Defect Detection Accuracy
〇Keiya Minakawa1, Hiromu Ishihara1, Reiji Kaneko1, Taiki Nakada1, Naoyuki Aikawa1, Takashi Ikuno1 (1.Tokyo Univ. of Sci.)
Keywords:
electrical impedance tomography,machine learning,nondestructive testing
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