Presentation Information
[15p-K203-2]Soft X-ray Spectromicroscopy: Technical Development and Progress in Applied Research
〇Takuo Ohkochi1,2,3 (1.LASTI, Univ. Hyogo, 2.JASRI, 3.SRC, RIKEN)
Keywords:
photoemission electron microscopy,synchrotron radiation,soft X-rays
This presentation will provide an overview of photoelectron emission microscopy (PEEM) in synchrotron spectromicroscopy, along with its characteristics and various functionalities. It will also introduce the practical technological developments and applied research examples at SPring-8, as well as the current infrastructure and research plans at NewSUBARU. Finally, the future prospects for synchrotron spectromicroscopy instruments and research will be discussed.
Comment
To browse or post comments, you must log in.Log in