Presentation Information

[15p-K403-10]Investigation of leakage current between reference electrode and gate electrode of GFETs

〇Kaori Yamamoto1, Natsuki Sato1, Mamiko Yano1, Kiyoji Sakano1, Eriko Ohnishi1, Shota Ushiba2, Shinsuke Tani2, Masahiko Kimura2, Hidekazu Tanaka1, kazuhiko Matsumoto1 (1.SANKEN, Osaka Univ., 2.Murata Mfg.)

Keywords:

graphene,SARS-CoV-2,FET


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