[16p-K308-1~14] 16.3 Bulk, thin-film and other silicon-based solar cells

1:45 PM - 2:00 PM JST(4:45 AM - 5:00 AM UTC)Presentation by Applicant for JSAP Young Scientists Presentation Award

[16p-K308-2] Influence of damp-heat and thermal cycling sequential test on reliability for unencapsulated crystalline Si photovoltaic modules with polycarbonate base

〇Yo Yamakawa¹, Mikami Yuta¹, Yasuhiro Okada², Yohei Ogasiwa², Hiroaki Takahashi², Naoshi Kimura³, Yasuaki Ishikawa⁴, Mitsunori Nagahara⁵, Keisuke Ohdaira⁵, Kazuhiro Gotoh^1,6, Atsushi Masuda^1,6 (1.Fac. Eng., Niigata Univ., 2.Kyocera Crop., 3.Okitsumo Inc., 4.Aoyama Gakuin Univ., 5.JAIST, 6.IRCNT, Niigata Univ.)

Keywords:

photovoltaic modules,aging test,recycle