Presentation Information
[16p-P11-9]Evaluation of noise reduction by photothermal excitation method for atomic force microscopy
〇(B)Daichi Hana1, Yuki Araki1, Masahiko Tomitori2, Toyoko Arai1 (1.Kanazawa Univ., 2.JAIST)
Keywords:
Scanning probe microscope,FM-AFM,photothermal excitation method
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