Presentation Information

[17a-K201-3]Establishment of a DSSD Readout System Using ASIC for Integration Tests with a Cherenkov Detector

〇Jo Sato1, Yuki Watanabe1, Takayoshi Kohmura1, Yuusuke Uchida1, Aiko Nagamatsu2, Toru Tamagawa3,4, Riichiro Nakamura3, Keisuke Uchiyama4, Naoyuki Ota4, Tomoshi Takeda4, Tadayuki Takahashi5, Shinichiro Takeda5, Masayuki Fujii6, Kouichi Hagino7, Shunsaku Nagasawa8 (1.TUS Grad School of Science and Technology, 2.JAXA, 3.RIKEN, 4.TUS Grad School of Science, 5.Kavli IPMU, 6.FAM science, 7.The University of Tokyo, 8.SSL/UC Berkeley)

Keywords:

semiconductor detector,radiation


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