Presentation Information

[17a-K503-4]Nanoscale observation of cell-cell junction interface by nanoendoscopy-AFM

〇Ren Takemura1, Daichi Yashiro1, Keisuke Miyazawa1,2, Takehiko Ichikawa2, Satoshi Toda3, Takeshi Fukuma1,2 (1.Kanazawa Univ., 2.WPI-NanoLSI, 3.Osaka Univ.)

Keywords:

Atomic Force Microscopy


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