Presentation Information

[10a-A21-10]Impacts of hole traps in GaOx interlayer on electrical properties of p-type GaN Schottky structures

〇Ryo Sakai1, Masahiro Hara1, Mikito Nozaki1, Takuma Kobayashi1, Heiji Watanabe1 (1.UOsaka)

Keywords:

GaN,Schottky junction,hole trap