Presentation Information
[10a-A21-10]Impacts of hole traps in GaOx interlayer on electrical properties of p-type GaN Schottky structures
〇Ryo Sakai1, Masahiro Hara1, Mikito Nozaki1, Takuma Kobayashi1, Heiji Watanabe1 (1.UOsaka)
Keywords:
GaN,Schottky junction,hole trap
